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專利查詢內容

年度(民國年) 93 領域 製造精進
執行單位 金屬中心
專利發明人 呂英誠、洪全成、葉光明、薛博文 核准國家 中華民國
專利名稱 投射式可調變圖紋之3D量測系統
計畫名稱 金屬二次加工自動化系統技術
證書號碼 I225147 專利性質 發明
獲証日期 93/12/11
專利期間 93/12/11 ~ 112/11/02
技術摘要
(中文)
本發明係有關於一種投射式可調變圖紋之3D量測系統,係用以量測一待測元件之表面狀態,該量測系統包括:一光源產生器、一反射鏡片、一處理單元、一數位式反射裝置及一影像擷取裝置。該光源產生器係用以產生一光線。該反射鏡片係用以反射該光線。該處理單元係產生一圖紋。該數位式反射裝置係接受該處理單元之控制,以將來自該反射鏡片之光線反射成與該圖紋相對應之樣式,且照射於該待測元件之表面。該影像擷取裝置係用以擷取該待測元件被照射後之影像,且將該擷取影像傳送至該處理單元,該處理單元比對該擷取影像與該圖紋之變化,以得到該待測元件之表面狀態。藉此,可以彈性編輯與調變投射圖紋,且可避免因CCD在分段取像時的移動造成振動進而影響資料之判讀與最終精度之誤差。
技術摘要
(英文)
The present invention relates to a three-dimensional measurement system using projective alterable patterns for measuring the surface profile of a component, comprising a light source, a reflective mirror, a process unit, a digital reflective device and an image capture device. The light source is used for generating a light beam. The reflective mirror is used for reflecting the light beam. The process unit is used for generating a pattern. The digital reflective device is controlled by the process unit so as to alter the light beam form the reflective mirror to become the model corresponding to the pattern, and projects the light beam to the surface of the element to be measured. The image capture device is used for capturing the image of the element to be measured, and transmitting the image to the process unit. The process unit analyses the difference between the pattern and the captured image to determine the surface profile of the component to be measured. Thereby, the projective pattern is programmable and alterable, and the error caused by the movement of the CCD camera when capturing images is avoided.
聯絡人員 黃偉咸 電子信箱 vincent@mail.mirdc.org.tw
電話 07-3513121分機2365 傳真 07-353-4062
參考網址 https://www.mirdc.org.tw/PatentList.aspx